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Hall Effect System
Product Overview:The Hall effect testing system is used to measure important parameters such as carrier concentration, mobility, resistivity, Hall coefficient, etc. of semiconductor materials, which must be controlled in advance to understand the electrical properties of semiconductor materials. Therefore, it is an essential tool for understanding and studying the electrical properties of semiconductor devices and semiconductor materials. This instrument is a Hall effect instrument with stable performance, powerful functions, and high cost-effectiveness. It has a wide range of users and popularity in domestic universities, research institutes, and the semiconductor industry. The instrument is lightweight, convenient, and easy to carry. The JH10 effect meter specially developed for this instrument system integrates a constant current source, a six and a half position microvoltmeter, and a Hall measurement complex cut matrix switch, greatly reducing the need for experimental wiring and
System composition:
Electromagnetic coil, high-precision power supply, Gaussian meter, high-precision constant current source, high-precision voltmeter, Hall probe, cable, standard sample, sample mounting bracket, system software.
Testeable materials:
Semiconductor materials: SiGe, SiC, InAs, InGaAs, InP, AlGaAs, HgCdTe, and ferrite materials, etc; Low impedance materials: graphene, metals, transparent oxides, weak magnetic semiconductor materials, TMR materials, etc;
High impedance materials: semi insulating GaAs, GaN, CdTe, etc.
Model category:
JH60A (electromagnetic type), JH60B (high magnetic field type), JH60C (high and low temperature magnetic field type), JH60D (low temperature type), JH60E (high resistance type)
